Microwave Imaging Using the Finite Element Method and a Sensitivity Analysis Approach.
Ioannis T. RekanosStavros M. PanasTheodoros D. TsiboukisPublished in: IEEE Trans. Medical Imaging (1999)
Keyphrases
- sensitivity analysis
- managerial insights
- phased array
- influence diagrams
- high resolution
- medical imaging
- image processing
- image analysis
- imaging systems
- variational inequalities
- data acquisition
- atomic force microscopy
- imaging devices
- clinical applications
- light field
- synthetic aperture
- sufficient conditions
- special case
- optimal solution