Login / Signup

Challenges Associated with Realization of Lot Level Fab Out Forecast in a Giga Wafer Fabrication Plant.

Georg SeidelChing Foong LeeAik Ying TangSoo Leen LowBoon Ping GanWolfgang Scholl
Published in: WSC (2020)
Keyphrases
  • wafer fabrication
  • lessons learned
  • real world
  • short term
  • technical challenges
  • learning algorithm
  • long term
  • database
  • data sets
  • information technology
  • higher level
  • computer aided