Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design.
Yacoub M. El-ZiqHamid H. ButtPublished in: ITC (1984)
Keyphrases
- life cycle
- design process
- mixed mode
- metamodel
- concurrent engineering
- product design
- testing process
- mass production
- requirements engineering
- case study
- product development
- conceptual design
- business models
- product life cycle
- expert systems
- development life cycle
- network design
- black box
- computer aided
- building blocks
- data model
- real world