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Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information.
Xiaoyan Zheng
Tong Sang
Ruohui Chen
Zeng Zeng
Published in:
CIS-RAM (2023)
Keyphrases
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input image
deep learning
spatial information
image retrieval
single image
region of interest
multiscale
image features
image content
object detection
image segmentation
image classification
segmentation method
image regions
light source
test images