Special Issue: 2019 PAINE Conference - Physical Assurance and Inspection of Electronics.
Navid AsadiMark M. TehranipoorPublished in: J. Hardw. Syst. Secur. (2020)
Keyphrases
- special issue
- ecml pkdd
- international journal
- ai edam
- applied intelligence
- special section
- advances in artificial intelligence
- selected papers
- real world
- quality control
- information security
- international conference
- invited talk
- databases and information systems
- poster session
- program committee
- annual conference
- intelligent systems
- information technology
- multimedia