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Testing PUF-based secure key storage circuits.

Mafalda CortezGijs RoelofsSaid HamdiouiGiorgio Di Natale
Published in: DATE (2014)
Keyphrases
  • secure communication
  • test cases
  • data storage
  • security issues
  • storage and retrieval
  • high security
  • encryption key
  • real time
  • neural network
  • high speed
  • storage requirements
  • private key