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Effects of stress-loading test methods on the degradation of light-emitting diode modules.
Miao Cai
Dao-Guo Yang
Jianna Zheng
Jianlin Huang
Dongjing Liu
Jing Xiao
Ping Zhang
Guoqi Zhang
Xianping Chen
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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light emitting
preprocessing
neural network
genetic algorithm
computer simulation
benchmark datasets
statistical significance
data mining
image analysis
computational cost
denoising
data mining techniques
empirical studies