Binary Decision Tree Using K-means and Genetic Algorithm for Recognizing Defect Patterns of Cold Mill Strip.
Kyoung Min KimJoong Jo ParkMyung Hyun SongIn-Cheol KimChing Y. SuenPublished in: IEA/AIE (2004)
Keyphrases
- binary decision tree
- genetic algorithm
- k means
- neural network
- support vector machine
- spectral clustering
- defect detection
- data clustering
- fitness function
- clustering method
- data sets
- pattern discovery
- genetic programming
- fuzzy logic
- expectation maximization
- website
- cluster analysis
- machine learning
- feature selection
- artificial neural networks
- job shop scheduling problem
- training data
- clustering algorithm