A Method for Measuring Process Variations in the FPGA Chip Considering the Effect of Wire Delay.
Yukiya MiuraShingo TsutsumiPublished in: IOLTS (2021)
Keyphrases
- preprocessing
- high accuracy
- experimental evaluation
- cost function
- prior knowledge
- data sets
- dynamic programming
- real time
- classification process
- k means
- artificial neural networks
- objective function
- image processing
- computational cost
- low cost
- support vector machine svm
- clustering method
- detection method
- optimization method
- matching process