Classification of Ultra-High Resolution Orthophotos Combined with DSM Using a Dual Morphological Top Hat Profile.
Qian ZhangRongjun QinXin HuangYong FangLiang LiuPublished in: Remote. Sens. (2015)
Keyphrases
- high resolution
- image processing
- classification accuracy
- machine learning
- feature extraction
- preprocessing
- support vector machine svm
- classification scheme
- automatic classification
- pattern recognition
- feature vectors
- neural network
- pattern classification
- classification algorithm
- low resolution
- model selection
- image classification
- feature space
- feature selection
- training samples
- feature set
- face images
- machine learning methods
- field of view
- data sets
- classification systems
- classification process
- pattern spectra