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Testing methods for a write-assist disturbance-free dual-port SRAM.
Hao-Yu Yang
Chen-Wei Lin
Chao-Ying Huang
Ching-Ho Lu
Chen-An Lai
Mango Chia-Tso Chao
Rei-Fu Huang
Published in:
VTS (2014)
Keyphrases
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computational cost
artificial intelligence
information systems
machine learning methods
computationally expensive
data mining
preprocessing
significant improvement
benchmark datasets
classification method