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Testing methods for a write-assist disturbance-free dual-port SRAM.

Hao-Yu YangChen-Wei LinChao-Ying HuangChing-Ho LuChen-An LaiMango Chia-Tso ChaoRei-Fu Huang
Published in: VTS (2014)
Keyphrases
  • computational cost
  • artificial intelligence
  • information systems
  • machine learning methods
  • computationally expensive
  • data mining
  • preprocessing
  • significant improvement
  • benchmark datasets
  • classification method