Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks.
Grégoire CaronAnatoli B. JuditskyNicolas GuitardDidier CéliPublished in: BCICTS (2022)
Keyphrases
- neural network
- high density
- positive and negative
- pattern recognition
- genetic algorithm
- user profiles
- circuit design
- back propagation
- low power
- integrated circuit
- fuzzy logic
- field effect transistors
- multilayer perceptron
- power consumption
- low cost
- parallel processing
- recurrent neural networks
- real time
- multi layer
- fuzzy systems
- multi layer perceptron
- activation function
- image recovery
- high power
- recovery algorithm
- failure recovery