Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding.
Paul M. RosingerBashir M. Al-HashimiNicola NicoliciPublished in: ICCD (2002)
Keyphrases
- low power
- pattern generation
- mixed mode
- power consumption
- low cost
- high speed
- single chip
- wireless transmission
- high power
- code generation
- vlsi circuits
- digital signal processing
- logic circuits
- vlsi architecture
- cmos technology
- low power consumption
- cellular automaton
- delay insensitive
- data processing
- web applications
- gate array