A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm.
Yoseop LimJaeseok ParkSungho KangPublished in: IEICE Electron. Express (2012)
Keyphrases
- selection algorithm
- significant improvement
- high accuracy
- reduction method
- computationally efficient
- candidate set
- pairwise
- clustering method
- detection method
- support vector machine svm
- segmentation method
- optimization algorithm
- feature subset selection
- multiple objects
- optimization method
- data sets
- language model
- image features
- preprocessing
- neural network