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Novel AlInN/GaN integrated circuits operating up to 500 °C.

Remis GaskaM. GaevskiJ. DengR. JainG. SiminMichael S. Shur
Published in: ESSDERC (2014)
Keyphrases
  • integrated circuit
  • electron beam
  • structuring elements
  • neural network
  • knowledge base
  • clustering algorithm
  • low cost
  • mathematical morphology