Login / Signup

A set of test structures for the development of a CMOS-MEMS technology.

Carlos Ramón Báez ÁlvarezMónico Linares ArandaAlfonso Torres-JácomeWilfrido Calleja ArriagaJavier de la Hidalga Wade
Published in: CCE (2016)
Keyphrases
  • rapid development
  • case study
  • small number
  • st century
  • real time
  • data processing
  • computational science
  • analog vlsi
  • neural network
  • development process