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Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design.
Cong Xu
Dimin Niu
Yang Zheng
Shimeng Yu
Yuan Xie
Published in:
ACM Trans. Design Autom. Electr. Syst. (2015)
Keyphrases
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building blocks
data mining
information systems
design process
design decisions
design tools
database
real time
data structure
user interface
case based reasoning
knowledge based systems
main memory
design methodology
optimal design