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Flip-flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage.

Ashok Kumar SuhagVivek ShrivastavaNidhi Singh
Published in: Int. J. Syst. Assur. Eng. Manag. (2013)
Keyphrases
  • power dissipation
  • case study
  • video sequences
  • image analysis
  • computer systems
  • machine vision
  • multiple input