Polycrystalline Silicon Wafer Scratch Segmentation based on Deep Convolutional Autoencoder.
Navin RanjanSovit BhandariYeong-Chan KimHoon KimPublished in: ICEIC (2022)
Keyphrases
- deep learning
- level set
- restricted boltzmann machine
- image segmentation
- segmentation algorithm
- shape prior
- energy function
- si sio
- deep belief networks
- segmentation method
- higher order
- multiscale
- active contours
- unsupervised learning
- medical images
- fully automatic
- object segmentation
- thin film
- unsupervised feature learning
- computer vision
- machine learning
- medical imaging
- semi supervised
- pairwise