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Reduced Pin-Count Test Strategy for 3D Stacked ICs Using Simultaneous Bi-Directional Signaling Based Time Division Multiplexing.

Iftikhar A. SoomroMohammad SamieIan K. Jennions
Published in: IEEE Access (2021)
Keyphrases
  • bi directional
  • associative memory
  • english chinese
  • test data
  • search algorithm
  • high dimensional
  • video streams
  • statistical significance
  • heuristic search algorithms