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A CAM-Based Weakly Supervised Method for Surface Defect Inspection.

Xiaojun WuTuo WangYiming LiPeng LiYunhui Liu
Published in: IEEE Trans. Instrum. Meas. (2022)
Keyphrases
  • weakly supervised
  • probabilistic model
  • three dimensional
  • bayesian networks
  • support vector machine
  • segmentation method