Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs.
Takumi InabaHiroshi OkaHidehiro AsaiHiroshi FuketaShota IizukaKimihiko KatoShunsuke ShitakataKoichi FukudaTakahiro MoriPublished in: IEEE Access (2024)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- frequency band
- high frequency components
- subband
- low pass
- wavelet analysis
- original images
- low and high frequency
- electromagnetic fields
- wavelet coefficients
- discrete wavelet transform
- multiresolution
- visual quality
- high resolution
- contourlet transform
- image compression
- low voltage
- fusion rules
- denoising