Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects.
Sungho SuhShinya ItohSatoshi AoyamaShoji KawahitoPublished in: Sensors (2010)
Keyphrases
- noise reduction
- image sensor
- signal to noise ratio
- dynamic range
- cmos technology
- video camera
- low power
- edge detection
- single chip
- image processing algorithms
- digital camera
- power consumption
- circuit design
- high speed
- hardware and software
- low cost
- cmos image sensor
- analog to digital converter
- parallel processing
- imaging systems
- dynamic scenes
- motion blur
- missing data
- low voltage