Data-driven solutions of ill-posed inverse problems arising from doping reconstruction in semiconductors.
Stefano PianiPatricio FarrellWenyu LeiNella RotundoLuca HeltaiPublished in: CoRR (2022)
Keyphrases
- inverse problems
- image reconstruction
- data driven
- emission tomography
- shape estimation
- global optimization
- convex optimization
- regularization methods
- regularization method
- optimization methods
- optimization problems
- early vision
- partial differential equations
- high resolution
- super resolution
- computer vision
- three dimensional
- computationally expensive
- multi view
- image segmentation
- optimal solution
- multiresolution
- evolutionary algorithm
- object recognition