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Drain currents and their excess noise in triple gate bulk p-channel FinFETs of different geometry.
N. Lukyanchikova
N. Garbar
Valeriya Kudina
A. Smolanka
Eddy Simoen
Cor Claeys
Published in:
Microelectron. Reliab. (2013)
Keyphrases
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multiple input
signal to noise ratio
noise level
field effect transistors
noise sensitivity
three dimensional
random noise
carrier frequency offset
noisy data
noise reduction
communication channels
gaussian noise
direct sequence spread spectrum
noisy environments
additive noise
multi channel
input data