A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line.
Antonio H. ChanGordon W. RobertsPublished in: ITC (2001)
Keyphrases
- high resolution
- low resolution
- data acquisition
- image processing
- measurement data
- remote sensing
- super resolution
- high frequency
- spatial resolution
- field of view
- affine invariant
- high resolution images
- multiscale
- affine transformation
- satellite images
- high quality
- scanning devices
- multi view
- portable devices
- image sequences
- image super resolution
- magnetic resonance images
- real time
- face images
- low cost
- feature points