Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias.

Behzad Ebrahimi Ali Afzali-Kusha Nader Sehatbakhsh

Published in: DTIS (2013)

Keyphrases

cmos technology
nm technology
random access memory
power consumption
real time
database
low cost
multi dimensional
design process
design methodology
design considerations
power dissipation