Multi defect detection and analysis of electron microscopy images with deep learning.
Mingren ShenGuanzhao LiDongxia WuYuhan LiuJacob GreavesWei HaoNathaniel J. KrakauerLeah KrudyJacob PerezVarun SreenivasanBryan SanchezOigimer TorresWei LiKevin FieldDane MorganPublished in: CoRR (2021)