A SoC Test Strategy Based on a Non-Scan DFT Method.
Hiroshi DateToshinori HosokawaMichiaki MuraokaPublished in: Asian Test Symposium (2002)
Keyphrases
- high accuracy
- preprocessing
- pairwise
- computational cost
- segmentation method
- image processing
- prior knowledge
- significant improvement
- cost function
- dynamic programming
- discrete fourier transform
- statistical significance
- optimization method
- frequency domain
- detection method
- detection algorithm
- model selection
- experimental evaluation
- similarity measure
- face recognition