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Product-level reliability estimator with budget-based reliability management in 20nm technology.

Jae-Gyung AhnMing Feng LuNitin NavaleDawn GravesPing-Chin YehJonathan ChangS. Y. Pai
Published in: IRPS (2015)
Keyphrases
  • least squares
  • decision making
  • decision support
  • product quality
  • reliability analysis
  • management system
  • computer vision
  • maximum likelihood
  • maximum a posteriori
  • product development