Impact of transistor aging effects on sense amplifier reliability in nano-scale CMOS.

Roberto Menchaca Hamid Mahmoodi

Published in: ISQED (2012)

Keyphrases

nano scale
high speed
low power
software aging
high power
circuit design
negative effects
negative impact
low cost
positive effects
interaction effects
power consumption
application server
anecdotal evidence
analog vlsi
high sensitivity
real time
image processing
data sets