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Collect and Select: Semantic Alignment Metric Learning for Few-Shot Learning.

Fusheng HaoFengxiang HeJun ChengLei WangJianzhong CaoDacheng Tao
Published in: ICCV (2019)
Keyphrases
  • metric learning
  • learning process
  • learning algorithm
  • prior knowledge
  • learning tasks
  • pattern recognition
  • distance metric learning
  • feature selection
  • image processing
  • video sequences
  • semi supervised
  • multi task