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Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection.
Tomi Roinila
Hongjiang Zeng
Jarmo Verho
Yu Xiao
Matti Vilkko
Pasi Kallio
Jukka Lekkala
Tie Li
Yuelin Wang
Published in:
Microelectron. J. (2014)
Keyphrases
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pseudorandom
uniformly distributed
random number
random numbers
secret key
user specific
real time
high speed
database systems
principal component analysis
x ray
high density
stream cipher