Login / Signup

Measuring resistivity of silicon nanowire using pseudo-random binary sequence injection.

Tomi RoinilaHongjiang ZengJarmo VerhoYu XiaoMatti VilkkoPasi KallioJukka LekkalaTie LiYuelin Wang
Published in: Microelectron. J. (2014)
Keyphrases
  • pseudorandom
  • uniformly distributed
  • random number
  • random numbers
  • secret key
  • user specific
  • real time
  • high speed
  • database systems
  • principal component analysis
  • x ray
  • high density
  • stream cipher