Fault Characterization and Testability Considerations in Multi-Valued Logic Circuits.

Mostafa I. H. Abd-El-Barr Maher Al-Sherif Mohamed Osman

Published in: ISMVL (1999)

Keyphrases

multi valued
logic circuits
logic synthesis
low power
single valued
functional decomposition
tunnel diode
normal form
boolean functions
gate array
power consumption
high speed
special case
neural network
power dissipation
database applications
pairwise
database