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Numerical analysis of a double avalanche region IMPATT diode on the basis of nonlinear model.

Alexander ZemliakRoque De La Cruz
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • numerical analysis
  • nonlinear models
  • image enhancement
  • control law
  • linear model
  • linear models
  • statistical models
  • decision trees
  • optical flow
  • least squares
  • edge detection
  • logistic regression
  • closed loop
  • arima model