Multiple-pulse dynamic stability and failure analysis of low-voltage 6T-SRAM bitcells in 28nm UTBB-FDSOI.
Kaya Can AkyelLorenzo CiampoliniOlivier ThomasBertrand Pelloux-PrayerShishir KumarPhilippe FlatresseChristophe LecocqGérard GhibaudoPublished in: ISCAS (2013)
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