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Development of a Cyber-Physical System based on selective Gaussian naïve Bayes model for a self-predict laser surface heat treatment process control.
Javier Díaz
Concha Bielza
Jose L. Ocaña
Pedro Larrañaga
Published in:
ML4CPS (2015)
Keyphrases
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process control
control system
product quality
development process
bayes classifiers
manufacturing process
semiconductor manufacturing
bayesian classifiers
high speed
context aware
intrusion detection
information processing