Login / Signup
Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits.
Chang Cai
Ze He
Tianqi Liu
Gengsheng Chen
Jian Yu
Liewei Xu
Jie Liu
Published in:
IEEE Access (2020)
Keyphrases
</>
feature set
high speed
small number
low level
probability distribution
predictive features
data sets
feature space
feature selection
prior knowledge
training set
d objects
low cost
feature extraction
decision trees
benchmark datasets
software testing