General-purpose image forensics using patch likelihood under image statistical models.

Wei Fan Kai Wang François Cayre

Published in: WIFS (2015)

Keyphrases

statistical models
general purpose
image features
image data
single image
input image
image content
statistical model
image segmentation
image classification
multiscale
image analysis
image representation
edge detection
image processing
image regions
graphical models
bayesian networks
machine learning
statistical modeling