Electromigration lifetimes and void growth at low cumulative failure probability.

Hideaki Tsuchiya Shinji Yokogawa

Published in: Microelectron. Reliab. (2006)

Keyphrases

failure rate
probability distribution
highly reliable
decision making
database
website
learning algorithm
artificial intelligence
image processing
case study
long term
special case
conditional probabilities
high levels
failure detection