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The Expected Values of Self- and Mutual Impedances of Overhead Lines and Impacts of on Sags and Phase Conductor Imbalances: Part 2.

Insu Kim
Published in: IEEE Access (2021)
Keyphrases
  • expected values
  • straight line
  • line segments
  • learning phase
  • phase information
  • feature selection
  • higher order
  • image quality
  • marginal distributions