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Test Chip for Identifying Spice-Parameters of Cryogenic BiFET Circuits.
Oleg V. Dvornikov
Nikolay N. Prokopenko
Vladimir A. Tchekhovski
Yaroslav D. Galkin
Alexei V. Kunz
Anna V. Bugakova
Published in:
ESSDERC (2019)
Keyphrases
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built in self test
analog vlsi
high speed
circuit design
maximum likelihood
low cost
parameter estimation
parameter space
parameter values
parameter settings
chip design
single chip
power dissipation