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Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications.

François RoyAndrej SulerThomas DalleauRomain DuruDaniel BenoitJihane ArnaudYvon CazauxCatherine ChatonLaurent MontèsPanagiota MorfouliGuo-Neng Lu
Published in: Sensors (2020)
Keyphrases
  • cmos image sensor
  • dynamic range
  • cmos technology
  • single chip
  • solid state
  • parallel processing
  • processing capabilities
  • low cost
  • real time
  • image processing
  • video sequences
  • edge detection
  • image restoration