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MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing.

David C. KeezerDany MinierPatrice DucharmeDoris ViensGreg FlynnJohn McKillop
Published in: VLSI Design (2008)
Keyphrases
  • classical logic
  • data sets
  • high speed
  • logic programming
  • test set
  • artificial intelligence
  • modal logic
  • automated reasoning
  • predicate logic
  • deontic logic
  • asynchronous circuits
  • proof theory
  • dual channel