Robust Adversarial Attack Against Explainable Deep Classification Models Based on Adversarial Images With Different Patch Sizes and Perturbation Ratios.
Thi-Thu-Huong LeHyoeun KangHowon KimPublished in: IEEE Access (2021)
Keyphrases
- classification models
- image data
- image database
- object recognition
- geometric distortions
- decision trees
- image retrieval
- image classification
- feature selection
- test images
- image matching
- input image
- feature points
- regular grid
- database
- genetic programming
- image registration
- machine learning
- neural network
- denoising
- semi supervised
- image features
- optimization method
- multi objective