Intelligent Localization Sampling System Based on Deep Learning and Image Processing Technology.
Shengxian YiZhongjiong YangLiqiang ZhouShaoxin ZouHuangxin XiePublished in: Sensors (2022)
Keyphrases
- deep learning
- image processing
- machine learning
- unsupervised learning
- unsupervised feature learning
- weakly supervised
- computer vision
- high resolution
- pattern recognition
- restricted boltzmann machine
- deep architectures
- supervised learning
- decision support
- appearance model
- multiscale
- image segmentation
- feature selection