A lifespan-aware reliability scheme for RAID-based flash storage.

Sehwan Lee Bitna Lee Kern Koh Hyokyung Bahn

Published in: SAC (2011)

Keyphrases

foreseeable future
neural network
detection scheme
storage management
real time
artificial intelligence
relational databases
data model
learning scheme
representation scheme
highly reliable
solid state
replacement policy
garbage collection
reliability assessment