Control of deposition height in WAAM using visual inspection of previous and current layers.

Jun Xiong Yiyang Zhang Yupeng Pi

Published in: J. Intell. Manuf. (2021)

Keyphrases

visual inspection
image analysis
printed circuit boards
control system
control method
registration accuracy
information systems
single layer
real time
information retrieval
search engine
image sequences
optimal control
multi layer
lower layers
fluorescence microscopy images