Rapid Estimation of the Probability of SRAM Failure due to MOS Threshold Variations.

Shweta Srivastava Jaijeet S. Roychowdhury

Published in: CICC (2007)

Keyphrases

probability distribution
failure rate
confidence level
power consumption
neural network
decision trees
face recognition
lower bound
hidden markov models
sensor networks
parameter estimation
threshold values
root cause
failure prediction