Extending specification patterns for verification of parametric traces.
Yoann BleinYves LedruLydie du BousquetRoland GrozPublished in: FormaliSE@ICSE (2018)
Keyphrases
- formal verification
- formal methods
- asynchronous circuits
- high level
- model checking
- pattern discovery
- design patterns
- frequent patterns
- database
- user defined
- learning algorithm
- pattern analysis
- neural network
- information systems
- similarity measure
- bayesian networks
- pattern mining
- artificial intelligence
- parametric models
- face verification
- data mining
- previously unknown
- databases